Semiconductor device and method for manufacturing semiconductor device
AssigneeMurata Manufacturing Co., Ltd.
InventorsTeiji Yamamoto, Masayuki Aoike, Hiroyuki Nagai
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AssigneeMurata Manufacturing Co., Ltd.
InventorsTeiji Yamamoto, Masayuki Aoike, Hiroyuki Nagai
Estimating the term…
A semiconductor device and a method for manufacturing a semiconductor device that enable characteristics to be improved are provided. A semiconductor device includes a substrate that has a first surface and a second surface that is located opposite the first surface, a first element that is disposed on the first surface, and a first resin layer that is disposed on the first surface and that is disposed around the first element in a plan view. The substrate includes a wiring layer. The first element includes a semiconductor layer, an electrode portion that is located on a surface of the semiconductor layer facing the substrate, and an insulating layer that is located opposite the electrode portion with the semiconductor layer interposed therebetween. The electrode portion is connected to the wiring layer. A height of the first resin layer from the first surface is more than a height of the first element from the first surface.
A semiconductor device comprising:
Dependencies are inferred from the claim text.