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US 11,776,637 B2Granted
Voltage sharing across memory dies in response to a charge pump failure
AssigneeWestern Digital Technologies, Inc.
InventorsElliott Rill, Daniel Linnen, Kirubakaran Periyannan
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Abstract
A die-to-die voltage sharing process that may be implemented to overcome a charge pump failure on a memory die of a non-volatile storage device. When a charge pump failure is detected, a controller causes another memory die with a functional charge pump to generate and supply a voltage to the memory die with the failed charge pump. When the voltage is received by the memory die with the failed charge pump, the voltage may be used to perform a requested memory operation.
Claims20
A method, comprising:
- detecting failure of a charge pump on a first NAND die;
- identifying a second NAND die that is electrically coupled to the first NAND die;
- providing instructions to the second NAND die that causes the second NAND die to generate a voltage for the first NAND die;
- providing instructions to the second NAND die that causes the second NAND die to provide the voltage to the first NAND die;
- providing instructions to the first NAND die that causes the first NAND die to accept the voltage from the second NAND die;
- and
- causing a memory operation to be performed on the first NAND die in response to the first NAND die receiving the voltage from the second NAND die.
4 more elements
A storage device, comprising:
- a non-volatile storage unit comprising a first memory die and a second memory die, each of the first memory die and the second memory die comprising a charge pump;
- and
- a controller communicatively coupled to the non-volatile storage unit and configured to:
- detect a failure of the charge pump on the first memory die;
- cause the charge pump of the second memory die to generate a voltage for the first memory die;
- and
- cause the second memory die to provide the generated voltage to the first memory die.
4 more elements
A storage device, comprising:
- a non-volatile storage unit comprising a first memory die electrically coupled to a second memory die, the first memory die and the second memory die comprising means for generating a voltage;
- means for detecting a voltage generating failure on the first memory die;
- means for causing the voltage generating means of the second memory die to generate a voltage for the first memory die;
- and
- means for causing the second memory die to provide the generated voltage to the first memory die.
2 more elements
Dependencies are inferred from the claim text.