Inspection method, program, inspection device, and printing device
AssigneeFUJIFILM Corporation
InventorMasaki Seki
Life of this patent
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AssigneeFUJIFILM Corporation
InventorMasaki Seki
Estimating the term…
Provided are an inspection method, a program, an inspection device, and a printing device capable of realizing a uniform inspection in a defect inspection of a printed article using a special substrate. A method includes an imaging data acquisition step (S14) of acquiring imaging data (48) of a printed article using a special substrate, a non-printing region positional information acquisition step (S16) of acquiring information (44) for specifying a position of a non-printing region in the imaging data, the non-printing region corresponding to a substrate region of the printed article on which a pattern and a background of the pattern are not printed, an inspection step (S20) of specifying the non-printing region, analyzing the imaging data by applying a predetermined inspection rule (46), and performing an inspection of the printed article, and a notification step (S22) of performing a notification of an inspection result (50) and not performing a notification of an inspection result indicating that a defect is present in the substrate region of the printed article corresponding to the non-printing region.
An inspection method comprising:
An inspection device comprising:
A printing device comprising:
A non-temporary computer-readable storage medium that causes a computer to execute, in a case in which a command stored in the storage medium is read by the computer,
Dependencies are inferred from the claim text.