Method and circuit for sensing MOSFET temperature for load switch application
AssigneeAlpha and Omega Semiconductor International LP
InventorsZhenyu Wang, Jian Yin, Lingpeng Guan, Sitthipong Angkititrakul, Christopher Ben Bartholomeusz, Xiaobin Wang
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Abstract
A method and device for temperature monitoring of a power transistor formed in a semiconductor die comprising are disclosed. A side of a temperature-sensing resistor disposed in the semiconductor die is coupled to a voltage input side of the power transistor. A controller coupled to a second side of the temperature-sensing resistor is configured to detect a voltage across the resistor and trigger a temperature related corrective action using the detected voltage.
Claims16
A device for temperature monitoring of a power transistor formed in a first semiconductor die comprising;
- a temperature-sensing resistor disposed in the first semiconductor die, wherein a side of the temperature-sensing resistor is coupled to the power transistor on a voltage input side of the transistor;
- a controller coupled to a second side of the temperature-sensing resistor wherein the controller is configured to detect a voltage across the resistor and trigger a temperature related corrective action using the voltage across temperature-sensing resistor, wherein the temperature related corrective action regulates a current though the power transistor.
A method for temperature control of a transistor formed in a first semiconductor die, comprising
- a) biasing a temperature-sensing resistor formed in the first semiconductor die by drawing input current from an input of the transistor;
- b) drawing a separate current through a parallel coupling connected to the input of the transistor, wherein the parallel coupling is connected in parallel with the temperature-sensing resistor;
- c) comparing an output voltage of the temperature-sensing resistor to an output voltage of the parallel coupling;
- d) using the result of the comparison to trigger a temperature related corrective action.
Dependencies are inferred from the claim text.