Apparatus and method of estimating values from images
AssigneeIllumina, Inc.
InventorsRobert Langlois, Bo Lu, Hongji Ren, Joseph Pinto, Simon Prince, Austin Corbett
Life of this patent
Estimating the term…
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AssigneeIllumina, Inc.
InventorsRobert Langlois, Bo Lu, Hongji Ren, Joseph Pinto, Simon Prince, Austin Corbett
Estimating the term…
A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
A method including:
An apparatus comprising:
Dependencies are inferred from the claim text.