Droop compensation for device under test spectroscopy

A system, comprising:

• a parameter determination circuit having a device input and a parameter output, the device input coupled to a device under test (DUT), and the parameter determination circuit configured to provide a frequency domain representation of a parameter of the DUT at the parameter output, the parameter having multiple cycles;
• a droop determination circuit having a first parameter input and a droop output, the first parameter input coupled to the parameter output, and the droop determination circuit configured to provide a frequency domain representation of a droop component of the parameter at the droop output responsive to the parameter, in which the droop component represents a rate of change of the parameter across one or more cycles of the multiple cycles;
• and
• a parameter adjustment circuit having a second parameter input, a droop input, and an adjusted parameter output, the second parameter input coupled to the parameter output, the droop input coupled to the droop output, and the parameter adjust circuit configured to provide an adjusted parameter of the DUT at the adjusted parameter output based on combining the respective frequency domain representations of the parameter and the droop component.

A non-transitory computer-readable medium comprising instructions that, when executed by a processor, cause the processor to:

• determine a frequency domain representation of a parameter of a device under test (DUT), the parameter having multiple cycles;
• determine a frequency domain representation of a droop component of the parameter based on the parameter, in which the droop component represents a rate of change of the parameter across one or more cycles of the multiple cycles;
• and
• generate an adjusted, parameter of the DUT based on combining the respective frequency domain representations of the parameter and the droop component.