Analyzer and method for regulations testing of a solar installation

A method of testing an electrical circuit of a solar panel, the method comprising:

• prior to testing the electrical circuit, electrically coupling a plurality of test leads between a respective plurality of input terminals of a test device and a respective plurality of test points of the electrical circuit;
• and
• performing a plurality of tests of the electrical circuit that includes:
• selectively coupling a first measurement circuit of the test device to the electrical circuit via a first set of input terminals and test leads and performing a first test of the electrical circuit, and
• selectively coupling a second measurement circuit of the test device to the electrical circuit via a second set of input terminals and test leads and performing a second test of the electrical circuit,
• wherein:
• the second test is different than the first test;
• the second set of input terminals and test leads is different than the first set of input terminals and test leads;
• the first and second tests are performed without changing the coupling of the plurality of test leads between the test device and the electrical circuit;
• the test points include a first test point, a second test point, a third test point, and a fourth test point;
• the first test point is a positive output terminal of the solar panel;
• the second test point is a negative output terminal of the solar panel;
• the third test point is a ground or reference potential electrically coupled to the solar panel;
• and
• the fourth test point of the electrical circuit is a conductive frame of the solar panel.

A system for testing an electrical circuit, the system comprising:

• a plurality of test leads, including at least a first test lead, a second test lead, a third test lead, and a fourth test lead that are each connectable to different test points of the electrical circuit;
• and
• a test device including:
• a plurality of input terminals, including at least a first input terminal configured to receive the first test lead, a second input terminal configured to receive the second test lead, a third input terminal configured to receive the third test lead, and a fourth input terminal configured to receive the fourth test lead;
• a plurality of measurement circuits, including at least a first measurement circuit, a second measurement circuit, and a third measurement circuit;
• a plurality of switches;
• and
• at least one processor configured to:
• perform a first test of the electrical circuit while one or more switches of the plurality of switches electrically couples the first input terminal and the second input terminal to the first measurement circuit,
• perform a second test of the electrical circuit while one or more switches of the plurality of switches electrically couples the third input terminal and the fourth input terminal to the second measurement circuit, wherein the second test is different than the first test, and the first and second tests are performed without changing connections of the plurality of test leads to the plurality of input terminals of the test device and the different test points of the electrical circuit,
• perform a third test of the electrical circuit while one or more switches of the plurality of switches electrically couples the first input terminal and the third input terminal to the third measurement circuit,
• perform a fourth test of the electrical circuit while one or more switches of the plurality of switches electrically couples the second input terminal and the third input terminal to the third measurement circuit, and
• perform a fifth test of the electrical circuit while one or more switches of the plurality of switches electrically couples the first input terminal to the second input terminal and to the third measurement circuit, and electrically couples the third input terminal to the third measurement circuit.