Re-programmable self-test
AssigneeTexas Instruments Incorporated
InventorsNeil John Simpson, Alan David Hales
Life of this patent
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Abstract
A built-in self-test (BIST) method includes providing expanded test patterns to a logic circuit under test, generating a first signature based on a response of the logic circuit to the expanded test patterns, generating a second signature based on the first signature, wherein the second signature is a compressed version of the first signature, selecting one of the first signature or the second signature in response to a control signal, comparing the selected one of the first signature or the second signature to an expected signature, and, based on the comparison of the selected one of the first signature or the second signature to the expected signature, determining that the logic circuit passes or fails BIST.
Claims11
An apparatus comprising:
- a compressor including a test result input and a compressed test result output;
- a shift register including a shift register input, a first shift register output, and a second shift register output, the shift register input coupled to the compressed test result output;
- an exclusive or (XOR) logic including a first input, a second input, and a XOR output, the first input coupled to the first shift register output, the second input coupled to the second shift register output;
- a selector including a first selector input, a second selector input, a selector control input, and a selector output, the first selector input coupled to the first shift register output, the second selector input coupled to the XOR output;
- and
- a comparator including a first comparator input, and a second comparator input, the first comparator input coupled to the selector output, the second comparator input coupled to an expected signature output.
Dependencies are inferred from the claim text.