Testing device and probe elements thereof

A testing device, the testing device comprising:

• a circuit substrate;
• a plurality of probe elements independent of each other and arranged at fixed intervals, each of the probe elements comprising a body, a first contact section and a second contact section, at least one of the body, the first contact section and the second contact section being provided with a plurality of strip-shaped perforations, a first end of the first contact section abutting an object under test, and a second end of the second contact section abutting the circuit substrate;
• a first housing disposed above each of the probe elements and abutting against a first lateral side of each of the probe elements;
• and
• a second housing disposed below each of the probe elements and abutting against a second lateral side of each of the probe elements,
• wherein two step structures are formed respectively on the first lateral side and the second lateral side of the body,
• wherein the first housing abuts against the step structure of the first lateral side and the second housing abuts against the step structure of the second lateral side, the first housing and the second housing fix the probe elements in the horizontal direction.