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US 11,768,154 B2Granted
Fourier transform infrared spectrophotometer
AssigneeShimadzu Corporation
InventorsHideaki Katsu, Takashi Muramatsu, Hiromasa Maruno, Naoji Moriya
Life of this patent
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Abstract
A Fourier transform infrared spectrophotometer includes a main interfersometer, a control interferometer, an infrared detector, a control light detector, and a beam splitter block. The beam splitter block is disposed between a beam splitter and the control light detector. The control light detector has an optical axis inclined with respect to an optical axis of a control interference light beam.
Claims10
A Fourier transform infrared spectrophotometer comprising:
- a main interferometer including an infrared light source that emits an infrared light beam, a beam splitter, a fixed mirror, and a moving mirror;
- a control interferometer including a control light source that emits a control light beam, the beam splitter, the fixed mirror, and the moving mirror;
- an infrared detector that detects an infrared interference light beam that is generated by the main interferometer and passes through a sample or is reflected by the sample;
- a control light detector that detects a control interference light beam generated by the control interferometer;
- and
- a beam splitter block disposed on an optical path of the control interference light beam and disposed between the beam splitter and the control light detector,
- wherein the control light detector has an incident surface, the incident surface having a normal line inclined with respect to an optical axis of the control interference light beam.
4 more elements
A Fourier transform infrared spectrophotometer comprising:
- a main interferometer including an infrared light source that emits an infrared light beam, a beam splitter, a fixed mirror, and a moving mirror;
- a control interferometer including a control light source that emits a control light beam, the beam splitter, the fixed mirror, and the moving mirror;
- an infrared detector that detects an infrared interference light beam that is generated by the main interferometer and passes through a sample or is reflected by the sample;
- a control light detector that detects a control interference light beam generated by the control interferometer;
- and
- at least one of a collimation optical system or a waveplate disposed on an optical path of the control light beam, wherein
- the collimation optical system is disposed between the control light source and the beam splitter,
- the waveplate is disposed between the moving mirror and the beam splitter or between the fixed mirror and the beam splitter, and
- the at least one of the collimation optical system or the waveplate has an optical axis inclined with respect to an optical axis of the control light beam.
6 more elements
Dependencies are inferred from the claim text.