Fine particle measurement device
AssigneeSumitomo Electric Industries, Ltd.
InventorsAkinori Kimura, Asako Motomura, Yoko Sugiyama, Hiroshi Suganuma
Life of this patent
Estimating the term…
Abstract
A fine particle measurement device includes a support stand (20) that has a groove (F) extending in a predetermined direction and is configured to support in the groove an observation container (10), which has an elongate shape and accommodates a liquid sample containing a fine particle therein such that an extending direction of the groove (F) coincides with a longitudinal direction of the observation container (10); and an imaging unit (40) that is configured to capture an image of the fine particle in the observation container (10) at a position where the support stand is out of a field of view, the observation container (10) being supported by the support stand (20).
Claims6
A fine particle measurement device comprising:
- a support stand that has a groove extending in a predetermined direction and is configured to support in the groove an observation container, which has an elongate shape and accommodates a liquid sample containing a fine particle therein, such that an extending direction of the groove coincides with a longitudinal direction of the observation container;
- and
- a plurality of imaging units each configured to capture an image of the fine particle in the observation container at a position where the support stand is out of a field of view, the observation container being supported by the support stand,
- wherein the observation container has two bottom walls made of two plate-shaped members, which are combined to form a bottom surface having a corner, and
- wherein the image units are configured to capture images of the same imaging target at the same time, so that one imaging target in the observation container can be identified from different directions.
Dependencies are inferred from the claim text.