Base resistance cancellation method and related methods, systems, and devices
AssigneeMicrochip Technology Incorporated
InventorsHyunsoo Yeom, Cheng Xu
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Abstract
Methods, systems and devices of the present disclosure involve techniques for cancelling base resistance error otherwise present in remote temperature sensors such as remote diode temperature sensors. In one or more embodiments, measurement logic configured to determine a temperature of or near a remote temperature sensor may be configured to determine an error cancelling coefficient and to calculate a temperature value, at least in part, responsive to the error cancelling coefficient. In some cases, error cancelling coefficients may be determined using one or more calibration techniques.
Claims12
An apparatus for sensing a temperature of a remote diode temperature sensor, comprising:
- a measurement circuit to:
- receive first values indicative of voltage levels exhibited across a diode located remote from the measurement circuit;
- determine at least two second values respectively indicative of a respective one of at least two voltage changes across the diode exhibited by the first values;
- and
- determine a third value indicative of a temperature at the diode, wherein the third value is determined at least partially responsive to the at least two second values, fourth values that represent current levels of currents for biasing the diode, and a fifth value representing a resistance of respective paths utilized to sense the voltage levels exhibited across the diode.
An apparatus having machine-readable instructions that, when executed by a processor comprising at least one processing core, enable the processor to:
- receive first values indicative of voltage levels exhibited across a diode located remote from a measurement circuit;
- determine at least two second values respectively indicative of a respective one of at least two voltage changes across the diode exhibited by the first values;
- and
- determine a third value indicative of a temperature at the diode, wherein the third value is determined at least partially responsive to the at least two second values, fourth values that represent current levels of currents for biasing the diode, and a fifth value representing a resistance of respective paths utilized to sense the voltage levels exhibited across the diode.
Dependencies are inferred from the claim text.