Group III nitride single crystal substrate

A aluminum nitride single crystal substrate comprising a main surface,

• the main surface having a face orientation of +c-face,
• the main surface having:
• a circular shape;
• or
• a circular shape comprising a cutout of an orientation flat,
• the substrate having a diameter of 20 to 210 mm,
• the main surface comprising:
• a center;
• a periphery;
• an outer region comprising the periphery;
• and
• an inner region comprising the center,
• wherein if the shape of the main surface has rotational symmetry, the center of the main surface is defined as a position of an axis of the rotational symmetry;
• and
• if the shape of the main surface is the circular shape comprising the cutout of the orientation flat and does not have rotational symmetry, the center of the main surface is defined as a center of an original circle, wherein the original circle is defined as a circle whose periphery has a longest total overlap with the periphery of the main surface;
• wherein a boundary separating the inner region and the outer region is defined as a trace drawn by a point when a line segment connecting the center and the periphery is rotated by a single rotation around the center wherein the point divides the line segment internally into a ratio of (distance from the center):(distance from the periphery) =3:7;
• the outer region is defined as a region outside the boundary;
• and
• the inner region is defined as a region inside the boundary comprising the boundary;
• wherein a ratio (νA−νB) /νB is within the range of ±0.1%,
• wherein νA is a minimum value of E2high peak wave numbers of micro-Raman spectra measured in a plurality of positions in the inner region;
• and
• νB is an average value of E2high h peak wave numbers of micro-Raman spectra measured in a plurality of positions in the outer region;
• wherein measurements of the micro-Raman spectra in the inner region are carried out by a first process comprising:
• a) acquiring a X-ray reflection topography image of the main surface of the substrate, by detecting CuKα1 ray diffracted by (114) plane of the substrate;
• b) if at least one bright spot is observed in the X-ray reflection topography image of the main surface obtained in the a), measuring micro-Raman spectra for at least 3 spots in the inner region, the at least 3 spots comprising all of the at least one bright spot;
• and
• c) if no bright spot is observed in the X-ray reflection topography image of the main surface obtained in the a), measuring micro-Raman spectra for at least 3 spots comprising the center and at least 2 different spots other than the center randomly selected from the inner region;
• wherein the X-ray reflection topography image of the main surface is acquired by a second process using a thin film X-ray diffractometer which is X′Pert Pro MRD from PANalytical B.V., the second process comprising:
• d) generating characteristic X-ray of 40000 cps in direct beam intensity from a Cu-target X-ray tube under the conditions of 45 kV of acceleration voltage and 40 mA of filament current, to take X-ray beam out by line focus;
• e) reflecting the X-ray beam generated in the d) by an X-ray mirror module, to obtain a horizontal X-ray beam of 1.2 mm in beam width, wherein the X-ray mirror module comprises a Goebel mirror and is equipped with a ½° lateral limitation slit and a vertical limitation slit of 50 μm in width, and wherein the lateral limitation slit and the vertical limitation slit is arranged at the entrance of the X-ray mirror module;
• f) irradiating the X-ray beam obtained in the e) onto the main surface of the substrate arranged on a measurement stage;
• and
• g) detecting the CuKα1 ray diffracted from the (114) plane of the aluminum nitride single crystal substrate by a two-dimensional semiconductor X-ray detector which is PIXcel 3D semiconductor detector from PANalytical B.V., to acquire an X-ray reflection topography image;
• wherein measurement spots of micro-Raman spectra in the outer region are at least 3 spots arranged at 2 mm intervals along the entire length of a first part of a first line segment, wherein the first line segment connects the center of the main surface and an arc part of the periphery, wherein the first part of the first line segment is a part of the first line segment belonging to the outer region, and wherein the first line segment is randomly selected to an extent that a crack which is inherently present in the aluminum nitride single crystal substrate, a foreign matter, or deviation of crystal orientation is not on the first line segment in the outer region;
• and
• wherein measurements of micro-Raman spectra are carried out by a third process using NRS-7100 micro-Raman spectrometer from JASCO Corporation, the third process comprising:
• h) concentrating an excitation laser of 531.98 nm in wavelength and of 10.8 mW in output power such that a diameter of a measurement spot becomes 1 μm, using a slit of 10 μm in width and of 1000 μm in length, a grating of 600 lines/mm, and an objective lens of 100 times magnification;
• i) irradiating the excitation laser to the main surface of the substrate, and averaging three measurement results each acquired with an exposure time of 5 seconds, to acquire a local Raman spectrum;
• and
• j) determining a peak wave number of an E2high Raman shift peak in calibrating wave numbers of the local Raman spectrum obtained in the i).