Processing system, measuring probe, shape measuring device, and program
AssigneesNikon Corporation, Dmg Mori Co., Ltd.
InventorsTomoaki Yamada, Shizuo Nishikawa, Satoshi Miyamoto, Junichi Morishita
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AssigneesNikon Corporation, Dmg Mori Co., Ltd.
InventorsTomoaki Yamada, Shizuo Nishikawa, Satoshi Miyamoto, Junichi Morishita
Estimating the term…
A processing system includes a control unit that generates positional information related to a position of a measuring unit at a time of measuring a processing object and outputs the generated positional information and a generation period signal indicating a period during which the positional information is generated, an acquisition unit that acquires the positional information and the generation period signal which have been output, an acquisition interval calculation unit that calculates a statistical value indicating an interval between acquisition periods regarding a plurality of generation period signals acquired by the acquisition unit, an estimation unit that estimates the period during which the positional information is generated on the basis of the statistical value calculated by the acquisition interval calculation unit, and a shape calculation unit that calculates a shape of the processing object based on measurement information, the positional information, and the period estimated by the estimation unit.
A processing system comprising:
A shape calculation system comprising:
A shape measuring probe which is configured to be attached to a machine tool, the shape measuring probe comprising:
A shape calculation device comprising:
A shape measurement method comprising:
A non-transitory computer-readable recording medium on which is stored a program that causes a computer to execute
A method for producing a processing object, the method comprising:
Dependencies are inferred from the claim text.