CMC-based method for surfactant concentration determination

A device, comprising:

• a measurement device for measuring a physical property of a solution, the measurement device selected from a tensiometer, a spectrometer, and an electrical conductivity meter;
• a non-transitory computer readable medium storing instructions executable by a computer processor, the instructions comprising functionality for:
• obtaining from the measurement device a plurality of physical property measurements of a sample with an unknown concentration (Cs) of a surfactant and of a benchmark solution with a known concentration of the surfactant;
• determining a critical micelle concentration (Ccm assumed) of the sample from the plurality of physical property measurements of the sample and based on an assumed surfactant concentration (Cassumed) of the sample;
• determining an actual critical micelle concentration (Ccm) of the surfactant in the benchmark solution from the plurality of physical property measurements of the benchmark solution;
• and
• calculating the unknown concentration (Cs) of the surfactant in the sample from the following equation:
• Cs=Ccm/(Ccm assumed/Cassumed);
• and
• at least one input device connected to the computer processor.