Voltage measurement device, voltage detection circuit, and device address generation method
AssigneeNuvoton Technology Corporation Japan
InventorsNaohisa Hatani, Jiro Miyake
Life of this patent
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Abstract
A voltage measurement device includes: a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits includes: a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.
Claims15
A voltage measurement device, comprising:
- a plurality of voltage detection circuits which measure cell voltages of a plurality of cells connected in series from a lowermost side to an uppermost side,
- wherein each of the plurality of voltage detection circuits includes a lowermost voltage detection circuit, an uppermost voltage detection circuit and one or more middle voltage detection circuits disposed between the lowermost voltage detection circuit and the uppermost voltage detection circuit, each of the one or more middle voltage detection circuits includes:
- a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage,
- the preceding voltage detection circuit is one of a lower voltage detection circuit located at a lower side or an upper voltage detection circuit located at an upper side among the plurality of voltage detection circuits, and the next voltage detection circuit is the other of the lower voltage detection circuit or the upper voltage detection circuit among the plurality of voltage detection circuits, and
- the device address generating circuit generates a same device address for (i) the device address according to the first address assignment command received from the lower voltage detection circuit and (ii) the device address according to the first address assignment command received from the upper voltage detection circuit.
A voltage detection circuit which measures cell voltages of a plurality of cells connected in series from a lowermost side to an uppermost side, the voltage detection circuit being one of a plurality of voltage detection circuits included in a voltage measurement device, the voltage detection circuit comprising:
- a device address generating circuit which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- an address assignment command generating circuit which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage,
- wherein the preceding voltage detection circuit is one of a lower voltage detection circuit located at a lower side or an upper voltage detection circuit located at an upper side among the plurality of voltage detection circuits, and the next voltage detection circuit is the other of the lower voltage detection circuit or the upper voltage detection circuit, and
- the device address generating circuit generates a same device address for (i) the device address according to the first address assignment command received from the lower voltage detection circuit and (ii) the device address according to the first address assignment command received from the upper voltage detection circuit.
A device address generating method performed by a voltage measurement device which measures cell voltages of a plurality of cells connected in series and includes a plurality of voltage detection circuits, the device address generating method comprising:
- generating a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage;
- and
- generating a second address assignment command according to the first address assignment command, and sending the second address assignment command to a next voltage detection circuit located at a next stage,
- wherein the preceding voltage detection circuit is one of a lower voltage detection circuit located at a lower side or an upper voltage detection circuit located at an upper side among the plurality of voltage detection circuits, and the next voltage detection circuit is the other of the lower voltage detection circuit or the upper voltage detection circuit, and
- the device address generating method comprises generating a same device address for (i) the device address according to the first address assignment command received from the lower voltage detection circuit and (ii) the device address according to the first address assignment command received from the upper voltage detection circuit.
Dependencies are inferred from the claim text.