Measuring deflection to determine a characteristic of a cantilever
AssigneeThe United States of America as represented by the Secretary of the Army
InventorsRebekah C Wilson, Benjamin C Masters
Life of this patent
Estimating the term…
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AssigneeThe United States of America as represented by the Secretary of the Army
InventorsRebekah C Wilson, Benjamin C Masters
Estimating the term…
Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.
A system for determining and comparing a first stress induced by a first process on a first target with a second stress induced by a second process on a second target, the system comprising:
Dependencies are inferred from the claim text.