Solar access measurement
AssigneeSunrun Inc.
InventorsWillard MacDonald, Robert MacDonald
Life of this patent
Estimating the term…
Loading patent…
AssigneeSunrun Inc.
InventorsWillard MacDonald, Robert MacDonald
Estimating the term…
A method of determining solar radiation exposure at a predetermined location is provided. The method may include generating a first two-dimensional (2D) matrix including a plurality of elements, wherein each element of the plurality of elements of the first 2D matrix includes an elevation/azimuth pair representing a light ray extending from the predetermined location to one or more positions in the sky. The method may further include generating a second 2D matrix including a plurality of elements, wherein each index of the second 2D matrix includes an associated elevation/azimuth pair of the first 2D matrix. Each element of the plurality of elements of the second 2D matrix represents an amount of solar radiation to impinge on the predetermined location from a direction of a respective elevation/azimuth pair.
A method of determining solar access at a predetermined position within a 3D CAD model utilizing a Solar Access Measurement Device (SAMD), the method comprising:
A method of determining solar access at a predetermined position within a 3D CAD model utilizing a Solar Access Measurement Device (SAMD), the method comprising:
A Solar Access Measurement Device (“SAMD”) located at a predetermined location, the SAMD configured to:
A Solar Access Measurement Device (“SAMD”) located at a predetermined location, the SAMD comprising:
Dependencies are inferred from the claim text.