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US 11,747,283 B2Granted
Docking station with waveguide enhanced analyte detection strip
AssigneeStrike Photonics, Inc.
InventorDaniel Carothers
Life of this patent
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Abstract
This disclosure presents a docking station into which a test card can be inserted for rapid analyte detection and reporting. This docking station has portable capability and can include wire or wireless transmission to a local server or cloud-based server. A test card that has a test structure located on the test structure that includes a modified waveguide can be inserted into the and a docking station that includes a laser and interferometer provides for accurate and rapid detection of a test sample.
Claims18
A test apparatus, comprising:
- a test card having a coupling end;
- and
- a test structure located on the test card, comprising:
- a silicon substrate;
- a planar waveguide formed on the silicon substrate and having an uncladded sensor portion comprising an outer surface and side surfaces, wherein the silicon substrate comprises a semiconductor material;
- nanoparticles located on the outer surface and on the side surfaces of the uncladded sensor portion of the planar waveguide, wherein a concentration of the nanoparticles is higher on the side surfaces of the planar waveguide than on the outer surface;
- a fluid input port located over the planar waveguide and in fluid communication with the planar waveguide that allows an analyte deposited into the fluid input port to contact the planar waveguide;
- and
- an optical output end that includes optical fibers located within v-grooves on the silicon substrate that are optically coupled to the planar waveguide and extend to the coupling end of the test card.
6 more elements
A test apparatus, comprising:
- a test card having one or more interconnected metal levels and a coupling end;
- and
- a test structure located on the test card, comprising:
- a silicon substrate;
- a planar waveguide formed on the silicon substrate and having an uncladded sensor portion comprising an outer surface and side surfaces, wherein the silicon substrate comprises a semiconductor material;
- nanoparticles located on the outer surface and on the side surfaces of the uncladded sensor portion of the planar waveguide, wherein a concentration of the nanoparticles is higher on the side surfaces of the planar waveguide than on the outer surface;
- a fluid input port located over the planar waveguide and in fluid communication with the planar waveguide that allows an analyte deposited into the fluid input port to contact the planar waveguide;
- and
- an optical output end that includes optical fibers located within v-grooves on the silicon substrate that are optically coupled to the planar waveguide and extend to the coupling end of the test card;
- and
- a docking station for receiving the coupling end of the test card therein,
- comprising:
- a housing having a test card interface that is configured to receive the coupling end of the test card therein;
- a laser located within the housing and optically aligned with the test structure to receive a transmission therefrom;
- an integrated interferometer and spectrometer located within the housing and optically couplable to the test structure to receive an optical transmission therefrom;
- and
- a data processor and control board located within the housing, the control board configured to control an operation of the laser, interferometer, and data processor and being operatively coupled thereto.
14 more elements
Dependencies are inferred from the claim text.