Sensor module for multiparametrically analysing a medium
AssigneeSentronic GmbH Gesellschaft FüR Optische Messsysteme
InventorMatthias Lau
Life of this patent
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Abstract
The invention relates to a sensor module (1) for multiparametric analysis of a medium (105) and to the uses thereof. The sensor module (1) according to the invention is characterised by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a substrate (100). A plurality of properties of a medium (105) can be detected over wide parameter ranges, wherein the most suitable method can be used for the corresponding parameter, at least for example with regard to the accuracy, the long-term stability, the resolution, the reproducibility, the energy consumption, the manufacturing costs, the necessary space requirements.
Claims22
Sensor module for multiparametric analysis of a medium, comprising
- at least one organic light emitter for emitting a first photonic signal and
- at least one device for detecting photonic signals, said device for detecting photonic signals being a detector;
- wherein the at least one organic light emitter and the at least one device for detecting photonic signals are monolithically formed on a semiconductor substrate or in a semiconductor substrate;
- at least one functional layer system which at least partially covers the at least one organic light emitter and/or the at least one device for detecting photonic signals and is in contact with the medium, wherein the functional layer system is in the form of a layer having at least one active region having at least one property that can be influenced by at least one property of the medium characterised in that the at least one active region of the functional layer system can be photonically excited by means of the at least one organic light emitter and emits a second photonic signal which is detected by the at least one device for detecting photonic signals, the second photonic signal containing information about the at least one property of the medium, and
- in that the semiconductor substrate is able to determine at least one second property by means of a non-photonic measurement principle or the sensor module has at least one component for determining at least one second property, which module is arranged on the semiconductor substrate or a carrier.
Dependencies are inferred from the claim text.