Retractable ion guide, grid holder, and technology for removal of cryogenic sample from vacuum
AssigneeWisconsin Alumni Research Foundation
InventorsMichael Scott Westphall, Joshua Jacques Coon
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AssigneeWisconsin Alumni Research Foundation
InventorsMichael Scott Westphall, Joshua Jacques Coon
Estimating the term…
Imaging by cryo-electron microscopy (cryo-EM) requires that a sample be encased in an amorphous solid, such as amorphous ice. In current cryo-EM preparation systems, once the sample has been deposited on an EM grid and coated in the amorphous solid, the EM grid must be removed from vacuum and then transferred into the vacuum of the cryo-EM system. As a result, samples deposited on the grid are exposed to damage and contamination. The present invention provides improved EM grid handling systems and devices compatible with advanced cryo-EM sample preparation techniques and which reduce or eliminate exposure of the sample on the grid to atmosphere and elevated temperatures. These methods and devices will also significantly reduce handling time and complexities associated with cryo-EM sample preparation.
A cryo-electron microscopy (cryo-EM) sample preparation system comprising:
A method for preparing a sample for cryo-electron microscopy (cryo-EM) comprising the steps of:
Dependencies are inferred from the claim text.