Capacitor measurement
AssigneeSTMicroelectronics S.r.l.
InventorsDavide Argento, Orazio Pennisi, Stefano Castorina, Vanni Poletto, Matteo Landini, Andrea Maino
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AssigneeSTMicroelectronics S.r.l.
InventorsDavide Argento, Orazio Pennisi, Stefano Castorina, Vanni Poletto, Matteo Landini, Andrea Maino
Estimating the term…
A system and method for measuring a capacitance value of a capacitor are provided. In embodiments, a resistor is coupled to a terminal of the capacitor. A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor is measured. The discharge routine includes sinking a current through a discharge circuit coupled to the resistor from first to second. Integration of a difference in voltage at terminals of the resistor during the discharge routine between the first and second times is also measured. The capacitance value is computed based on the measured difference in voltage, the measured integration, and the resistance value of the resistor. The health of the capacitor is determined based on a difference between the computed capacitance value and a threshold value.
A method for measuring a capacitance value of a capacitor, the method comprising:
A system for measuring a voltage drop of a reserve capacitor in a supplemental restraint system (SRS), the reserve capacitor having a capacitance value and an equivalent series resistor value, the system comprising:
A circuit for measuring a voltage drop of a reserve capacitor having a capacitance value and an equivalent series resistor value, the system comprising:
Dependencies are inferred from the claim text.