Efficient frequency detectors for clock and data recovery circuits
AssigneeSamsung Display Co., Ltd.
InventorValentin Abramzon
Life of this patent
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Abstract
A system and method for a frequency detector circuit includes: a transition detector configured to receive a data input and provide a first edge output based on transitions in the data input; a first circuit configured to generate a second edge output; a second circuit configured to generate a third edge output; and a combinational logic configured to output an UP output when at least two of the first edge output, the second edge output, and the third edge output are high and configured to output a DOWN output when the first edge output, the second edge output, and the third edge output are all low.
Claims18
A method of frequency detection comprising:
- sampling a data input to obtain an odd data sample of the data input (Dodd);
- sampling the data input to obtain an odd crossing sample of the data input (Xodd);
- sampling the data input to obtain an even data sample of the data input (Deven);
- sampling the data input to obtain an even crossing sample of the data input (Xeven);
- generating phase data based on the Dodd, Xodd, Deven, and Xeven samples responsive to a first mode selection input value;
- and
- generating frequency data based on the Dodd, Xodd, Deven, and Xeven samples responsive to a second mode selection input value.
A frequency detector and phase detector circuit comprising:
- a first slicer configured to sample a data input to output an odd data sample (Dodd);
- a second slicer configured to sample the data input to output an odd crossing sample (Xodd);
- a third slicer configured to sample the data input to output an even data sample (Deven);
- a fourth slicer configured to sample the data input to output an even crossing sample (Xeven);
- and
- a combinational logic circuit configured to:
- generate phase data based on the Dodd, Xodd, Deven, and Xeven samples responsive to a first mode selection input value;
- and
- generate frequency data based on the Dodd, Xodd, Deven, and Xeven samples responsive to a second mode selection input value.
Dependencies are inferred from the claim text.