Automated feature analysis of a structure
AssigneeSolaroid Corporation
InventorsDale Ziegler, Tim Szatko, Kevin Bence, Mohamed Ali
Life of this patent
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AssigneeSolaroid Corporation
InventorsDale Ziegler, Tim Szatko, Kevin Bence, Mohamed Ali
Estimating the term…
An automated structural feature and analysis system is disclosed. A 3D device emits a volume scanning 3D beam that scans a structure to generate 3D data that is associated with a distance between the 3D device and each end point of the 3D beam positioned on the structure. An imaging device captures an image of the structure to generate image data with the structure as depicted by the image of the structure. A controller fuses the 3D data of the structure generated by the 3D device with the image data of the structure generated by the imaging device to determine the distance between the 3D device and each end point of the 3D beam positioned on the structure and to determine a distance between each point on the image. The controller generates a sketch image of the structure that is displayed to the user.
An automated structural feature analysis system, comprising:
A method for automatically generating and analyzing structural features of a structure, comprising:
Dependencies are inferred from the claim text.