Multi-lane optical-electrical device testing using automated testing equipment
AssigneeOpenLight Photonics, Inc.
InventorSteven William Keck
Life of this patent
Estimating the term…
Abstract
A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
Claims20
A method comprising:
- actuating, using a handler of an automated testing system, an optical-electrical device to connect to an electric testing module of the automated testing system and to connect to an optical testing module of the automated testing system, the optical-electrical device connected to the electric testing module of the automated testing system using electrical connections while the optical-electrical device is connected to the optical testing module of the automated testing system using optical connections:
- configuring an optical test lane switch selector in a first configuration for optical testing of a first lane of the optical-electrical device;
- calibrating one or more optical components of the first lane of the optical-electrical device using the optical testing module while the optical test lane switch selector is in the first configuration and while one or more electrical components of the optical-electrical device are electrically connected to the electrical testing module;
- configuring the optical test lane switch selector in a second configuration for optical testing of a second lane of the optical-electrical device;
- and
- calibrating one or more other optical components of the second lane of the optical-electrical device using the optical testing module while the optical test lane switch selector is in the second configuration and while the one or more electrical components of the optical-electrical device are electrically connected to the electrical testing module.
An automated testing system for testing of an optical-electrical device, the automated testing system comprising,
- a handler to actuate the optical-electrical device to connect to an electric testing module of the automated testing system and connect to an optical testing module of the automated testing system, the optical-electrical device connected to the electric testing module of the automated testing system using electrical connections while the optical-electrical device is connected to the optical testing module of the automated testing system using optical connections;
- and
- an optical test lane switch selector that is configurable in a first configuration for optical testing of a first lane of the optical-electrical device and configurable in a second configuration for optical testing of a second lane of the optical-electrical device, wherein in the first configuration one or more optical components of the first lane of the optical-electrical device are calibrated using the optical testing module while one or more electrical components of the optical-electrical device are electrically connected to the electrical testing module, wherein in the second configuration one or more other optical components of the second lane of the optical-electrical device are calibrated using the optical testing module while the one or more electrical components of the optical-electrical device are electrically connected to the electrical testing module.
Dependencies are inferred from the claim text.