Metal-containing liner process
AssigneeTokyo Electron Limited
InventorsYusuke Yoshida, Sergey Voronin, Christopher Talone, Alok Ranjan
Life of this patent
Estimating the term…
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AssigneeTokyo Electron Limited
InventorsYusuke Yoshida, Sergey Voronin, Christopher Talone, Alok Ranjan
Estimating the term…
In an example, a method includes depositing a first sidewall spacer layer over a substrate having a layer stack including alternating layers of a nanosheet and a sacrificial layer, and a dummy gate formed over the layer stack, the first sidewall spacer layer formed over the dummy gate. The method includes depositing a metal-containing liner over the first sidewall spacer layer; forming a first sidewall spacer along the dummy gate by anisotropically etching the metal-containing liner and the first sidewall spacer layer; performing an anisotropic etch back process to form a plurality of vertical recesses in the layer stack; laterally etching the layer stack and form a plurality of lateral recesses between adjacent nanosheets; depositing a second sidewall spacer layer to fill the plurality of lateral recesses; and etching a portion of the second sidewall spacer layer to expose tips of the nanosheet layers.
A method of processing a substrate, the method comprising:
A method of processing a substrate, the method comprising:
A method of processing a substrate, the method comprising:
Dependencies are inferred from the claim text.