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AssigneeFanuc Corporation
InventorsWei Luo, Tsutomu Nakamura
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A frequency characteristic measurement device that measures the frequency characteristic of a measurement target includes: a multi-sine signal generation unit that generates a multi-sine signal; a sweep sinusoidal wave generation unit that generates a plurality of sweep sinusoidal waves; an input signal switching unit that selects any one of the multi-sine signal and the sweep sinusoidal waves so as to input the selected one to the measurement target; a data acquisition unit that acquires, at a predetermined sampling frequency, sampling data of an input signal which is input to the measurement target and sampling data of an output signal which is output from the measurement target; and a characteristic calculation unit that calculates a frequency characteristic including the gain and the phase of the input and output signals in the measurement target from the sampling data of the input and output acquired.
A frequency characteristic measurement device that supplies a sinusoidal signal to a measurement target so as to measure a frequency characteristic of the measurement target, the frequency characteristic measurement device comprising:
A frequency characteristic measurement method that supplies a sinusoidal signal to a measurement target so as to measure a frequency characteristic of the measurement target, the frequency characteristic measurement method comprising:
Dependencies are inferred from the claim text.