Testing apparatus for data storage devices

An interface module of a testing apparatus for testing Data Storage Devices (DSDs), the interface module comprising:

• a housing;
• a plurality of openings in a first side of the housing, each opening of the plurality of openings configured to receive a respective interface board;
• and
• a plurality of guide member pairs positioned to guide respective interface boards when inserted into respective openings of the plurality of openings such that a backplane connector of each respective interface board is located at a respective predetermined location with respect to the housing for directly connecting to a backplane of the testing apparatus.

A testing apparatus for testing Data Storage Devices (DSDs), the testing apparatus comprising:

• a chassis;
• means for housing a plurality of removable interface boards in the chassis, wherein each removable interface board of the plurality of removable interface boards is configured to be removably inserted into the means for housing the plurality of removable interface boards,
• wherein each removable interface board of the plurality of removable interface boards includes a DSD connector for connecting to a DSD and a backplane connector for connecting to a backplane for communicating with a respective computing unit;
• and
• a thermal isolation wall separating a first space within the chassis from the backplane, the first space configured to receive the means for housing the plurality of removable interface boards.