Universal switching platform and method for testing dynamic characteristics of a device

A universal switching platform configured to test a device under test, the device under test having a first terminal and a second terminal, said universal switching platform comprising:

• a first power source having a positive terminal, and a negative terminal that is configured to be coupled to the second terminal of the device under test;
• a first switch;
• a second switch;
• and
• a second power source;
• said first switch, said second switch and said second power source being coupled in series between said positive and negative terminals of said first power source, with said first switch coupled to said positive terminal of said first power source and said second power source coupled to said negative terminal of said first power source;
• a common node of said first and second switches being configured to be coupled to the first terminal of the device under test;
• said universal switching platform providing a voltage and a current to test the device under test when said first and second switches are controlled to transition between conduction and non-conduction.