Method of simulating an effect of interactions between a device under test and a scattering object and hybrid OTA test system

A method of simulating an effect of interactions between a device under test and a scattering object by a hybrid over-the-air (OTA) test system, wherein the hybrid OTA test system comprises an analysis circuit and a simulation circuit, the method comprising the steps of:

• determining, by the analysis circuit, at least one radiation parameter of the device under test, wherein the at least one radiation parameter is associated with electromagnetic waves emitted by the device under test;
• determining, by the simulation circuit, an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test;
• assigning, by the simulation circuit, material properties to a Huygens box confined by the Huygens surface, wherein the material properties are associated with at least one of reflection of electromagnetic waves and absorption of electromagnetic waves;
• and
• simulating, by the simulation circuit, an electromagnetic interaction between the device under test and the scattering object based on the determined equivalent source and based on the assigned material properties, thereby simulating an effect of interactions between the device under test and the scattering object.