X-ray fluorescence spectrometer and control method for x-ray fluorescence spectrometer

A control method for an X-ray fluorescence spectrometer,

• the X-ray fluorescence spectrometer including:
• a measuring unit including:
• a moving mechanism configured to move a sample between a standby position and a measurement position;
• an X-ray source configured to irradiate the sample with primary X-rays;
• a detector configured to measure an intensity of entering fluorescent X-rays;
• and
• a first control unit configured to control operations of the moving mechanism and the X-ray source;
• and
• an information processing unit including:
• an analysis unit configured to analyze the sample based on the intensity of the fluorescent X-rays measured by the detector;
• and
• a second control unit configured to control the measuring unit by communicating with the first control unit,
• the control method comprising the steps of:
• confirming whether communication between the first control unit and the second control unit has been interrupted;
• and
• performing retreat control for causing the moving mechanism to retreat the sample present at the measurement position to the standby position when it is confirmed that the communication has been interrupted.