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US 11,694,762 B2Granted
Memory device with a memory repair mechanism and methods for operating the same
AssigneeMicron Technology, Inc.
InventorsChristopher G. Wieduwilt, James S. Rehmeyer, Seth A. Eichmeyer
Life of this patent
Estimating the term…
Abstract
Methods, apparatuses and systems related to managing repair assets are described. An apparatus stores a repair segment locator and a repair address for each defect repair. The apparatus may be configured to selectively apply a repair asset to one of multiple sections according to the repair segment locator.
Claims20
An apparatus, comprising:
- a memory array including a plurality of memory cells and a plurality of redundant cells configured to replace one or more defective memory cells in the plurality of memory cells;
- a locator storage circuit configured to store a repair segment locator representing a segment within the memory array that includes the one or more defective memory cells;
- an address storage circuit configured to store a repair address representing a location of the one or more defective memory cells within the segment;
- and
- a segment-address determination circuit coupled to the locator storage circuit and configured to generate an active segment address based on the repair address and the repair segment locator, wherein the active segment address is for replacing the one or more defective memory cells with the plurality of redundant cells when an operation address or a portion thereof matches the active segment address.
2 more elements
A method of operating an apparatus that includes a plurality of memory cells and a plurality of redundant cells configured to replace one or more defective memory cells in the plurality of memory cells, the method comprising:
- storing a repair segment locator representing a segment within the memory array that includes the one or more defective memory cells;
- storing a repair address representing a location of the one or more defective memory cells within the segment;
- and
- comparing the repair address to a first portion of an operating address when the repair segment locator matches a second portion of the operating address;
- and
- replacing the one or more defective memory cells with the plurality of redundant cells when the first portion of the operating address matches the repair address.
3 more elements
Dependencies are inferred from the claim text.