Image enhancement for multi-layered structure in charged-particle beam inspection
AssigneeASML Netherlands B.V.
InventorsWei Fang, Ruochong Fei, Lingling Pu, Wentian Zhou, Liangjiang Yu, Bo Wang
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AssigneeASML Netherlands B.V.
InventorsWei Fang, Ruochong Fei, Lingling Pu, Wentian Zhou, Liangjiang Yu, Bo Wang
Estimating the term…
An improved method and apparatus for enhancing an inspection image in a charged-particle beam inspection system. An improved method for enhancing an inspection image comprises acquiring a first image and a second image of multiple stacked layers of a sample that are taken with a first focal point and a second focal point, respectively, associating a first segment of the first image with a first layer among the multiple stacked layers and associating a second segment of the second image with a second layer among the multiple stacked layers, updating the first segment based on a first reference image corresponding to the first layer and updating the second segment based on a second reference image corresponding to the second layer, and combining the updated first segment and the updated second segment to generate a combined image including the first layer and the second layer.
A method for enhancing an inspection image in a charged-particle beam inspection system, the method comprising:
An image enhancing apparatus comprising:
A non-transitory computer readable medium that stores a set of instructions that is executable by at least one processor of a computing device to perform a method for enhancing an image, the method comprising:
Dependencies are inferred from the claim text.