Circuit health state prediction method and system based on integrated deep neural network

Abstract

A circuit health state prediction method and system based on an integrated deep neural network are provided and relates to a technique for predicting a power electronic circuit failure. The invention serves to identify and diagnose a health state of a simulation circuit based on historical data by using an integrated deep neural network, and the method includes: carrying out parameter aging simulation experiments for different devices; extracting a series of time domain features of output signals through a temporal transformation method, and establishing health indices of the devices based on an improved angular similarity; predicting a health state of the simulation circuit in degeneration by using CAE and LSTM-RNN; and predicting validity of the circuit health state prediction method by referring to relevant evaluation indices. The invention is capable of effectively predicting the health state of the simulation circuit and is highly accurate and easy to implement.

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