Method for analyzing electromagnetic characteristic and electronic device
AssigneeWistron Neweb Corp.
InventorsAn-Ting Hsiao, Shun-Chung Kuo
Life of this patent
Estimating the term…
Loading patent…
AssigneeWistron Neweb Corp.
InventorsAn-Ting Hsiao, Shun-Chung Kuo
Estimating the term…
A method for analyzing electromagnetic characteristic includes steps as follows. An electromagnetic evaluation model establishing step is performed, which includes establishing an object unit, a power transmitting unit, and a simulating unit. The object unit is an arbitrary geometry shape. The power transmitting unit has an electromagnetic signal. The simulating unit is defined as at least one base point emitting a plurality of beams to form a plurality of projection points. An electromagnetic reference model is provided, wherein the object unit and the power transmitting unit are combined to form the electromagnetic reference model. A comparing step is performed, wherein a radiation pattern data of the electromagnetic reference model and a radiation pattern data of the electromagnetic evaluation model are obtained by the electromagnetic signal, respectively, and the two radiation pattern data are compared to obtain an electromagnetic gain difference value.
A method for analyzing electromagnetic characteristic, which is used to analyze an electromagnetic characteristic of an object coated with a plurality of metal dusts collocating with a power transmitting element, and the method for analyzing electromagnetic characteristic comprising:
An electronic device, comprising:
Dependencies are inferred from the claim text.