Enhanced in-system test coverage based on detecting component degradation
AssigneeNVIDIA Corporation
InventorsGunaseelan Ponnuvel, Ashish Karandikar
Life of this patent
Estimating the term…
Abstract
In various examples, permanent faults in hardware component(s) and/or connections to the hardware component(s) of a computing platform may be predicted before they occur using in-system testing. As a result of this prediction, one or more remedial actions may be determined to enhance the safety of the computing platform (e.g., an autonomous vehicle). A degradation rate of a performance characteristic associated with the hardware component may be determined, detected, and/or computed by monitoring values of performance characteristics over time using fault testing.
Claims20
A method comprising:
- performing multiple instances of a fault test on a hardware component of a computing platform by applying different values of a physical operating parameter to the hardware component for each of the instances;
- determining, from results of the multiple instances of the fault test, a value of the physical operating parameter at which the hardware component transitions from a pass of the fault test to a fail of the fault test;
- determining, based at least on the value of the physical operating parameter, a degradation rate indicating an amount of change to a cutoff value of the physical operating parameter at which the hardware component is capable of passing the fault test, the amount of change being relative to an elapsed time;
- determining the degradation rate exceeds a reference degradation rate;
- and
- determining one or more remedial actions based at least in part on the degradation rate exceeding the reference degradation rate.
A method comprising:
- applying one or more test parameters of a fault test to a hardware component of a computing platform to produce one or more outputs of the hardware component;
- determining a value of a performance characteristic of the hardware component based at least in part on analyzing the one or more outputs of the hardware component;
- determining a degradation rate of the hardware component based at least on the value of the performance characteristic, the degradation rate indicating an amount of change to a capability of the hardware component relative to an elapsed time;
- determining the degradation rate exceeds a reference degradation rate based at least in part on a measurement that indicates an operational duration of the hardware component;
- and
- determining one or more remedial actions based at least in part on the degradation rate of the performance characteristic exceeding the reference degradation rate.
A system comprising:
- a hardware component of an autonomous driving circuit of a vehicle, the hardware component used by the autonomous driving circuit to generate control signals that control autonomous driving of a vehicle while an operational value of a supply voltage is applied to the hardware component;
- and
- one or more processing devices to:
- execute multiple instances of a fault test on the hardware component by, at least in part, applying values of the supply voltage to the hardware component that are less than the operational value to determine a value that corresponds to a minimum supply voltage at which the hardware component is capable of passing the fault test;
- determine a degradation rate of the minimum supply voltage based at least on the value that corresponds to the minimum supply voltage, the degradation rate indicating an amount of change to the minimum supply voltage relative to an elapsed time;
- and
- determine one or more remedial actions based at least in part on the degradation rate of the minimum supply voltage.
Dependencies are inferred from the claim text.