Apparatus configured to perform a repair operation
AssigneeSK hynix Inc.
InventorByeong Chan Choi
Life of this patent
Estimating the term…
Abstract
An apparatus includes a storage area signal generation circuit configured to generate a storage area signal when performing an internal information storage operation and an external information storage operation; and an information storage circuit configured to receive internal failure information, stored in the apparatus, based on the storage area signal and store the received internal failure information as failure information in a set storage capacity, and store external failure information, applied from outside the apparatus, as the failure information in a variable storage capacity.
Claims38
An apparatus comprising:
- a storage area signal generation circuit configured to generate a storage area signal when performing an internal information storage operation and an external information storage operation;
- and
- an information storage circuit configured to receive internal failure information, stored in the apparatus, based on the storage area signal and store the received internal failure information as failure information in a set storage capacity, and store external failure information, applied from outside the apparatus, as the failure information in a variable storage capacity, the variable storage capacity being adjusted depending on the set storage capacity.
The apparatus according to claim wherein the information storage circuit comprises a plurality of failure information storage circuits which receive one of the internal failure information and the external failure information and store the received information as the failure information, a sum of the set storage capacity and the variable storage capacity being set as a storage capacity of the plurality of failure information storage circuits.
An apparatus comprising:
- a first failure information storage circuit configured to receive first internal failure information stored in the apparatus and store the received first internal failure information as first failure information, when performing an internal information storage operation, and activate a first comparison control signal;
- and
- a first failure information comparison circuit configured to generate a first match signal by comparing external failure information, applied from outside the apparatus, with the first failure information based on the first comparison control signal in an external information reception mode, the first match signal being activated to control whether to activate the first comparison control signal.
An apparatus comprising:
- a first failure information storage circuit configured to receive external failure information applied from outside the apparatus and store the received external failure information as first failure information, in a first external information reception mode, and activate a first comparison control signal;
- and
- a first failure information comparison circuit configured to generate a first match signal by comparing the external failure information, applied in a second external information reception mode, with the first failure information based on the first comparison control signal, the first match signal being activated to control whether to activate the first comparison control signal.
An apparatus comprising:
- a failure information storage circuit configured to receive one of internal failure information stored in the apparatus and external failure information applied from outside the apparatus and store the received information as failure information, and generate a comparison control signal by receiving an internal information storage flag and an external information storage flag;
- and
- a failure information comparison circuit configured to generate a match signal for a repair operation, by comparing a combination of a row address with the failure information based on the comparison control signal when performing an active operation.
An apparatus comprising:
- an information storage circuit configured to receive internal failure information stored in the apparatus and store the received internal failure information as first failure information, and receive external failure information applied from outside the apparatus and store the received external failure information as second failure information;
- an information comparison circuit configured to, when performing an active operation, generate an internal match signal by comparing a combination of a row address with the first failure information, and generate an external match signal by comparing a combination of the row address with the second failure information;
- and
- a repair control circuit configured to generate a first match signal for a repair operation, based on the internal match signal, and generate a second match signal for the repair operation, based on the external match signal, the external match signal being activated to control whether to activate the first match signal.
Dependencies are inferred from the claim text.