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US 11,693,179 B2Granted
Wavelength checker
AssigneeNippon Telegraph and Telephone Corporation
InventorsTakuya Tanaka, Hiroshi Ishikawa, Kota Shikama
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AssigneeNippon Telegraph and Telephone Corporation
InventorsTakuya Tanaka, Hiroshi Ishikawa, Kota Shikama
Estimating the term…
A wavelength checker includes an optical waveguide chip. A known arrayed-waveguide diffraction grating is formed on the optical waveguide chip. The wavelength checker includes a light conversion unit made of a conversion material that converts infrared light into visible light. The light conversion unit is arranged on an output side of a plurality of first output waveguides of the optical waveguide chip to be capable of receiving light emitted from the plurality of first output waveguides. The light conversion unit is formed on a side surface of a support facing an output end surface of the optical waveguide chip. The support is fixed to a main board.
A wavelength checker comprising:
A method comprising:
Dependencies are inferred from the claim text.
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From the US filing history. Foreign family members aren’t listed.
No references of this kind are recorded.
Of the integrated circuit kind: forming wavelength selective elements, e.g. multiplexer, demultiplexer
Comprising arrayed waveguide grating [AWG] devices, i.e. with a phased array of waveguides: characterised by the input or output waveguides, e.g.…
Photometry, e.g. photographic exposure meter: using luminescence generated by light
Comprising arrayed waveguide grating [AWG] devices, i.e. with a phased array of waveguides: characterised by the wavefront splitting or combining…
About 13 years 10 months of term left · ends 12 Aug 2040 (estimated)
This application is a national phase entry of PCT Application No. PCT/JP2019/043838, filed on Nov. 8, 2019, which claims priority to Japanese Application No. 2018-219011, filed on Nov. 22, 2018, which applications are hereby incorporated herein by reference.
The present invention relates to a wavelength checker, and more particularly to a wavelength checker for checking signal light during operational/failure isolation inspection of a PON system.
In a PON (Passive Optical Network)-based access system in an optical communication system, a plurality of types of light having relatively distant wavelengths such as a wavelength of 1.3 μm and a wavelength of 1.5 to 1.6 μm may be used at the same time.
FIG. 1 is a plan view showing a configuration of a wavelength checker according to Embodiment 1 of the present invention.
FIG. 2A is a cross-sectional view showing a partial configuration of the wavelength checker according to Embodiment 1 of the present invention.
FIG. 2B is a cross-sectional view showing a partial configuration of the wavelength checker according to Embodiment 1 of the present invention.
Wavelength checkers according to embodiments of the present invention will be described below.
First, a wavelength checker according to Embodiment 1 of the present invention will be described with reference to FIG. 1.
The wavelength checker includes an optical waveguide chip 101. A known arrayed-waveguide diffraction grating is formed on the optical waveguide chip 101 (see Patent literature 1). The arrayed-waveguide diffraction grating includes a first arrayed waveguide 103, a first input-side slab waveguide 104, a first output-side slab waveguide 105, a first input waveguide 106, and a first output waveguide 107. FIG. 1 shows a plane of the wavelength checker. Reference numeral 151 denotes a main board, reference numeral 109 denotes a support, and reference numeral 102 denotes a light conversion unit made of a conversion material that converts near-infrared light into visible light. In addition, reference numeral 161 denotes a fiber block, reference numeral 162 denotes an optical fiber, and reference numeral 163 denotes a connector.