System and method for measuring second order and higher gradients
AssigneeTrustees of Boston University
InventorsJoshua Javor, David Bishop, David Campbell, Matthias Imboden
Life of this patent
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AssigneeTrustees of Boston University
InventorsJoshua Javor, David Bishop, David Campbell, Matthias Imboden
Estimating the term…
A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
A gradiometer for measuring a gradient of an external magnetic field comprising:
A method of determining a change in a gradient of an external magnetic field, comprising:
A method of assembling a magnet array for a gradiometer comprising:
Dependencies are inferred from the claim text.