Conductive particle and testing socket comprising the same
AssigneeSnow Corporation
InventorGyu Sun Kim
Life of this patent
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Abstract
An embodiment of the present invention provides a conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, wherein the conductive particle comprises a plurality of protrusions formed at equal intervals along a circumference.
Claims14
A conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, the conductive particle comprising:
- a center;
- and
- first to fourth protrusions each having a square shape protruding in a radial direction from a side surface of the center,
- wherein the conductive particle has a predetermined thickness t and a predetermined diameter d, and
- wherein the first to the fourth protrusions are arranged at equal intervals along a circumferential direction of a circumference having the predetermined diameter d with respect to the center.
A conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, the conductive particle comprising:
- a center;
- and
- first to third protrusions each having a square shape protruding in a radial direction from a side surface of the center,
- wherein the conductive particle has a predetermined thickness t and a predetermined diameter d, and
- wherein the first to the third protrusions are arranged at equal intervals along a circumferential direction of a circumference having the predetermined diameter d with respect to the center.
Dependencies are inferred from the claim text.