Back to results
US 11,693,026 B2Granted
Test carrier
AssigneeAdvantest Corporation
InventorToshiyuki Kiyokawa
Life of this patent
Estimating the term…
Abstract
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, including: a movable valve that: opens by suction through the through hole such that the DUT is sucked through the through hole.
Claims15
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, the test carrier comprising:
- a movable valve that:
- opens by suction through the through hole such that the DUT is sucked through the through hole, wherein
- the movable valve moves or deforms by the suction through the through hole.
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, the test carrier comprising:
- a movable valve that:
- opens by suction through the through hole such that the DUT is sucked through the through hole;
- a holder that holds the DUT;
- and
- a lid that covers the DUT and is detachably attached to the holder, wherein
- the lid comprises a lid body, and
- the through hole is formed in and penetrates the lid body.
4 more elements
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, the test carrier comprising:
- a movable valve that:
- opens by suction through the through hole such that the DUT is sucked through the through hole, wherein
- the through hole comprises:
- a first hole part;
- an accommodating chamber that connects to the first hole part and accommodates the movable valve in a movable or deformable state;
- and
- a second hole part that connects to the first hole part via the accommodating chamber, and
- the movable valve opens by suction through the through hole such that the first hole part and the second hole part communicate with each other.
5 more elements
Dependencies are inferred from the claim text.