Particle analysis using light microscope and multi-pixel polarization filter

An optical system, comprising:

• a sample holder configured to fix a sample object,
• a light microscope, which defines an illumination light path and a detection light path for microscopy of the sample object with polarized light,
• at least one camera comprising a multi-pixel detector having a multiplicity of detector pixel elements, and a multi-pixel polarization filter having a multiplicity of polarization filter pixel elements, wherein the multi-pixel polarization filter is arranged between the sample holder and the multi-pixel detector in the detection light path, wherein the multi-pixel detector is configured to provide image data, wherein the at least one camera furthermore comprises a multi-pixel spectral filter having a multiplicity of spectral filter pixel elements, which is arranged upstream of the multi-pixel detector in the detection light path, and
• a computer logic element configured to calculate at least one polarization image of the sample object on the basis of the image data,
• wherein the computer logic element is furthermore configured to carry out a particle analysis for a surface of the sample object on the basis of the at least one polarization image.