Temperature sensor thermal contact testing method and circuit
AssigneeSamsung SDI Co., Ltd.
InventorsMaximilian Hofer, Helmut Hammerschmied
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung SDI Co., Ltd.
InventorsMaximilian Hofer, Helmut Hammerschmied
Estimating the term…
The present invention relates to a testing method for the thermal contact between a temperature sensor (50) and a battery cell (10) of a battery module (30), wherein the method comprises the steps of measuring a temperature T1 of the temperature sensor (50) at a time point t1, heating the temperature sensor (50) for a defined time (t2−t1), measuring a temperature T2 of the temperature sensor (50) at a time point t2 and/or a temperature T3 of the temperature sensor (50) at a time point t3, and determining the thermal contact between the temperature sensor (50) and the battery cell (10) based on at least one of the temperature differences ΔT2,1=(T2−T1), ΔT3,1=(T3−T1) and/or ΔT3,2=(T3−T2). The invention further relates to a testing circuit (60) for a temperature sensor (50) of a battery module (30), comprising a thermistor (61) with a first node (67) connected to a first supply voltage (65) and a second node (68) connected to ground (69), a switch (63) interconnected between the first node (67) of the thermistor (61) and a second supply voltage (66), and an analog-to-digital converter (64) connected in parallel to the thermistor (61). The invention further relates to a cell supervision circuit (40) for a battery module (30), comprising a circuit carrier (45), a testing circuit (60) according to any one of the claims 1 to 10, and a temperature sensor (50) surface mounted to the circuit carrier (45) and comprising a measuring head (51) with a thermistor (61) configured to be brought into thermal contact with a battery cell (10) of the battery module (30).
A testing circuit for a temperature sensor of a battery module, the testing circuit comprising:
Dependencies are inferred from the claim text.