Method of using polishing pad
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChunHung Chen, Jung-Yu Li, Sheng-Chen Wang, Shih-Sian Huang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChunHung Chen, Jung-Yu Li, Sheng-Chen Wang, Shih-Sian Huang
Estimating the term…
A method of using a polishing pad includes applying a slurry to a first location on the polishing pad. The method further includes rotating the polishing pad. The method further includes spreading the slurry across a first region of the polishing pad at a first rate, wherein the first region includes a plurality of first grooves, a first material property of the first region varies in a thickness direction of the polishing pad, each of the plurality of first grooves extends through at least two variations in the first material property, and the first material property comprises porosity, specific gravity or absorbance. The method further includes spreading the slurry across a second region of the polishing pad at a second rate different from the first rate, wherein the second region comprises a plurality of second grooves.
A method of using a polishing pad, the method comprising:
A method of using a polishing pad, the method comprising:
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