Method for cleaning substrate
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHao-Ming Chang, Chia-Shih Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHao-Ming Chang, Chia-Shih Lin
Estimating the term…
A method for cleaning a substrate is provided. The method includes following operations. A substrate is received. The substrate has a plurality of conductive nanoparticles disposed over a surface of the substrate. A first mixture is applied to remove the conductive nanoparticles. The first mixture includes an SCl solution, DI water and O3. A second mixture is applied to the photomask substrate. The second mixture includes DI wafer and H2. A temperature of the second mixture is between approximately 20° C. and 40° C. The applying of the second mixture further includes a mega sonic agitation, and a frequency of the mega sonic agitation is greater than 3 MHz. A flow rate of the first mixture is between approximately 1000 ml/min and approximately 5000 ml/min. A flow rate of the second mixture is between 1000 ml/min and approximately 3000 ml/min.
A method for cleaning a substrate, comprising:
A method for cleaning a substrate, comprising:
A method for cleaning a substrate, comprising:
Dependencies are inferred from the claim text.