Semiconductor device, semiconductor device fabrication method, and electronic device
AssigneeFujitsu Limited
InventorsShirou Ozaki, Toshihiro Ohki, Kozo Makiyama, Junya Yaita
Life of this patent
Estimating the term…
Loading patent…
AssigneeFujitsu Limited
InventorsShirou Ozaki, Toshihiro Ohki, Kozo Makiyama, Junya Yaita
Estimating the term…
A semiconductor device includes a source electrode and a drain electrode located over a surface of a semiconductor layer including an electron transit layer and an electron supply layer. A gate electrode is located between the source electrode and the drain electrode. A first diamond layer is located between the source electrode and the drain electrode over the surface with an insulating film therebetween. A second diamond layer is located directly on the surface between the gate electrode and the drain electrode. Of heat generated by the semiconductor layer of the semiconductor device in operation, heat on the side of the electrode on which a relatively strong electric field is applied is efficiently transferred to the second diamond layer. The semiconductor device achieves an excellent heat dissipation property from the semiconductor layer and effectively suppresses overheating and a failure and degradation of the characteristics due to the overheating.
A semiconductor device comprising:
An electronic device comprising:
Dependencies are inferred from the claim text.