Nanosheet transistor with self-aligned dielectric pillar

Abstract

Embodiments of the present invention are directed to a semiconductor structure and a method for forming a semiconductor structure having a self-aligned dielectric pillar for reducing trench silicide-to-gate parasitic capacitance. In a non-limiting embodiment of the invention, a nanosheet stack is formed over a substrate. A dielectric pillar is positioned adjacent to the nanosheet stack and on a shallow trench isolation region of the substrate. The nanosheet stack is recessed to expose a surface of the shallow trench isolation region and a source or drain (S/D) region is formed on the exposed surface of the shallow trench isolation region. A contact trench is formed that exposes a surface of the S/D region and a surface of the dielectric pillar.

Dependencies are inferred from the claim text.