Apparatus of plural charged-particle beams
AssigneeASML Netherlands B.V.
InventorsXuedong Liu, Weiming Ren, Shuai Li, Zhongwei Chen
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Abstract
One modified source-conversion unit and one method to reduce the Coulomb Effect in a multi-beam apparatus are proposed. In the modified source-conversion unit, the aberration-compensation function is carried out after the image-forming function has changed each beamlet to be on-axis locally, and therefore avoids undesired aberrations due to the beamlet tilting/shifting. A Coulomb-effect-reduction means with plural Coulomb-effect-reduction openings is placed close to the single electron source of the apparatus and therefore the electrons not in use can be cut off as early as possible.
Claims20
A source-conversion unit comprising:
- a first array having a lens configured to:
- deflect an off-axis electron beamlet of a plurality of electron beamlets;
- and
- compensate a first portion of aberrations of a probe spot formed on a sample by the deflected off-axis electron beamlet.
Dependencies are inferred from the claim text.