Managing block retirement for temporary operational conditions
AssigneeMicron Technology, Inc.
InventorsKishore Kumar Muchherla, Sampath K. Ratnam, Scott A. Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton, Christopher S. Hale
Life of this patent
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Abstract
A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device further designates the block as a quarantined block, performs a stress test on the block, and depending on whether the stress test on the block satisfies a testing criterion, either designates the block as usable by the memory component or retires the block of the memory component.
Claims20
A system comprising:
- a memory component;
- and
- a processing device, operatively coupled with the memory component, to perform operations comprising:
- detecting a data loss occurrence in a block of the memory component;
- designating the block as a quarantined block;
- performing a stress test on the block of the memory component;
- and
- depending on whether the stress test on the block of the memory component satisfies a testing criterion, either designating the block as usable by the memory component or retiring the block of the memory component, wherein the testing criterion is based on a variance of a first stress test result of the stress test on the block from a stored second stress test result of a second stress test on a second block previously designated as usable by the memory component.
A method comprising:
- detecting, by a processing device, a data loss occurrence in a block of a memory component;
- designating the block as a quarantined block,
- performing a stress test on the block of the memory component;
- and
- depending on whether the stress test on the block of the memory component satisfies a testing criterion, either designating the block as usable by the memory component or retiring the block of the memory component, wherein the testing criterion is based on a variance of a first stress test result of the stress test on the block from a stored second stress test result of a second stress test on a second block previously designated as usable by the memory component.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- detecting a data loss occurrence in a block of a memory component;
- designating the block as a quarantined block,
- performing a stress test on the block of the memory component;
- and
- depending on whether the stress test on the block of the memory component satisfies a testing criterion, either designating the block as usable by the memory component or retiring the block of the memory component, wherein the testing criterion is based on a variance of a first stress test result of the stress test on the block from a stored second stress test result of a second stress test on a second block previously designated as usable by the memory component.
Dependencies are inferred from the claim text.