Configuration tool and method for a quality control system
AssigneeArkite NV
InventorIves De Saeger
Life of this patent
Estimating the term…
Abstract
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
Claims15
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, said configuration tool comprising:
- (A) a volumetric sensor adapted to capture volumetric image frames of said working environment while an object, event or operational process is demonstrated;
- (B) a display, coupled to said volumetric sensor and configured to live display said volumetric image frames;
- and
- (C) a processor configured to:
- (C1) generate a user interface in overlay of said volumetric image frames to enable a user to define a layout zone;
- (C2) automatically generate a virtual box in said layout zone when an object, event or operational process is detected during demonstration of said object, event or operational process;
- and
- (C3) select a precision parameter for said virtual box, said precision parameter being one of:
- a fill level;
- an occlusion level;
- a standard deviation;
- or
- another parameter describing a change in a virtual box,
- wherein the parameter with highest difference between subsequent volumetric image frames during demonstration of said operational process is selected as precision parameter.
A configuration method for configuring a quality control system to monitor and/or guide an operator in a working environment through recognition of events, said configuration method comprising:
- (A) capturing volumetric image frames of said working environment while an object, event or operational process is demonstrated through a volumetric sensor;
- (B) live displaying said volumetric image frames;
- (C1) generating a user interface in overlay of said volumetric image frames to enable a user to define a layout zone;
- (C2) automatically generating a virtual box when an object, event or operational process is detected during demonstration of said object, event or operational process;
- and
- (C3) selecting a precision parameter for said virtual box, said precision parameter being one of:
- a fill level;
- an occlusion level;
- a standard deviation;
- or
- another parameter describing a change in a virtual box,
- wherein the parameter with highest difference between subsequent volumetric image frames during demonstration of said operational process is selected as precision parameter.
A quality control system for monitoring and/or guiding an operator in a working environment, said quality control system being coupled to a volumetric sensor for observing predetermined virtual boxes for presence or absence of a physical object or an operational action, said quality control system comprising:
- a configuration tool adapted to configure said quality control system, said configuration tool comprising:
- (A) said volumetric sensor adapted to capture volumetric image frames of said working environment while an object, event or operational process is demonstrated;
- (B) a display, coupled to said volumetric sensor and configured to live display said volumetric image frames;
- (C) a processor configured to:
- (C1) generate a user interface in overlay of said volumetric image frames to enable a user to define a layout zone;
- and
- (C2) automatically generate a virtual box in said layout zone when an object, event or operational process is detected during demonstration of said object, event or operational process;
- (C3) select a precision parameter for said virtual box, said precision parameter being one of:
- a fill level;
- an occlusion level;
- a standard deviation;
- or
- another parameter describing a change in a virtual box,
- wherein the parameter with highest difference between subsequent volumetric image frames during demonstration of said operational process is selected as precision parameter.
Dependencies are inferred from the claim text.